Fitting Method and Error Study for Tau Lifetime Measurements of L3 Experiment

  • The sign-flip probability of the impact parameter in the measurement of the tau lifetime is studied. The probability of the impact parameter with the negative value is introduced into the formula to fit the tau lifetime in the L3 experiment.The systematic errors of the drift velocity and grid time calibration are also studied by using the special designed L3 Time Expansion Chamber (TEC).
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  • [1] M.Perletal,Phys.Rev.Lett.,35(1975)1489.[2]DASP Colla,Phys.Lett,B73(1978)109;DELCO Colla,Phys.Lett,42(1979)749.[3]Y.S,Tsai,Phys.Rev.,D4(1971)2821.[4]BES合作组,高能物理与核物理,16(1992)865.[5]Rev.of Particle Properties,Phys Lett,B239(1990)1-516.[6]L3 Colla,Nucl.Instr.and Meth,A289(1990)35.[7]TEC group,”Construction and Performance of the L3 Central Tracking Detector“,to be submitted to NIM.[8]杨长根,τ轻子寿命测量,高能物理研究所博士论文,1993.[9]L3 Colla.,Phys.Lett.,B273(1991)451.[10]L3 Colla,CERN-PPE/93-31.[11]杨长根等,高能物理与核物理,18(1994)687.
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Yang Changgen, Chen Hesheng, Jin Bingnian and Tang Xiaowei. Fitting Method and Error Study for Tau Lifetime Measurements of L3 Experiment[J]. Chinese Physics C, 1994, 18(9): 794-799.
Yang Changgen, Chen Hesheng, Jin Bingnian and Tang Xiaowei. Fitting Method and Error Study for Tau Lifetime Measurements of L3 Experiment[J]. Chinese Physics C, 1994, 18(9): 794-799. shu
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Received: 1900-01-01
Revised: 1900-01-01
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Fitting Method and Error Study for Tau Lifetime Measurements of L3 Experiment

    Corresponding author: Yang Changgen,
  • Institute of High Energy Physics, Acadamia Sinica, Beijing 1000392 ETH-Z, Institute fur Hochenergiephysik, 8093-Zurich, Switzerland

Abstract: The sign-flip probability of the impact parameter in the measurement of the tau lifetime is studied. The probability of the impact parameter with the negative value is introduced into the formula to fit the tau lifetime in the L3 experiment.The systematic errors of the drift velocity and grid time calibration are also studied by using the special designed L3 Time Expansion Chamber (TEC).

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