THE NUMERICAL CALCULATION USED IN THICK TARGET PIXE ANALYSES

FAN Qin-Min; Zhong Ming

Chinese Physics C> 1988, Vol. 12> Issue(1) : 6-11

THE NUMERICAL CALCULATION USED IN THICK TARGET PIXE ANALYSES

FAN Qin-Min ^, ,
Zhong Ming

Institute of High Energy Physics,Academia Sinica

Abstract
HTML
Reference
Related

PDF

Abstract：
The numerical calculation were used to correct the measured K X-ray intensities in thick target PIXE analyses for the following matrix effects: slowing down of protons,absorption of characteristic X-ray,and X-ray induced X-ray emission in the sample.The efficiency calibrations for PIXE analysis system were made by means of the Monte Carlo technique.Based on these corrections and calibrations,the PIXE analysis results on some thick speciments made by ourself were obtained without the use of standard and they showed a good agreement between the measured and the known values of contents.

References

[1]

P. M. A. Van der Kam et al., N. I. M. 142(1977), 55.[2] 0. Meyer et al, "Ion Beam Surface Layer Analysis" (1976).[3] A. E. Johansson et al., N. 1. M. 137(1976), 473.[4] M. S. Ahlberg, N. I. M. 142(1977), 61.[5] R. Akselsson and T. B. Johansson, Z. Physik, 266(1974), 245.[6] 范钦敏等, 核技术, No.3(1985), 15.[7] M. Khaliquzzaman et al., N. I. M. 216(1983), 481.

Access

Get Citation

FAN Qin-Min and Zhong Ming. THE NUMERICAL CALCULATION USED IN THICK TARGET PIXE ANALYSES[J]. Chinese Physics C, 1988, 12(1): 6-11.

FAN Qin-Min and Zhong Ming. THE NUMERICAL CALCULATION USED IN THICK TARGET PIXE ANALYSES[J]. Chinese Physics C, 1988, 12(1): 6-11. shu

RIS(for EndNote,Reference Manager,ProCite)

BibTex

Txt

Milestone

Received: 1900-01-01
Revised: 1900-01-01

Article Metric

Article Views(3330)
PDF Downloads(473)
Cited by(0)

Policy on re-use

To reuse of subscription content published by CPC, the users need to request permission from CPC, unless the content was published under an Open Access license which automatically permits that type of reuse.

通讯作者: 陈斌, bchen63@163.com

1.
沈阳化工大学材料科学与工程学院沈阳 110142