Measuring and Analyzing Transverse Low-Energy Ion Beam Emittances

M.P.Stockli

Chinese Physics C> 2007, Vol. 31> Issue(S1) : 182-186

Measuring and Analyzing Transverse Low-Energy Ion Beam Emittances

M.P.Stockli ^,

Spallation Neutron Source*, Oak Ridge National Lab, Oak Ridge, TN 37831, USA

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Abstract：
The transverse emittance of an ion beam describes its transverse size as the particles are transported from a source to a target. It allows for predicting beam losses in limiting apertures and the beam focus size at the target. Various definitions and issues are discussed. The most common and emerging measuring techniques are presented, including their advantages. Several methods of emittance data analysis, their accuracy and trustworthiness, are discussed.

References

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. Lejeune C, Aubert J. In: Applied Charged Particle Optics,Part A, A. Septier edt., Academic Press, New York, 1980,159-2592. Lichtenberg A J. Phase Space Dynamics of Particles, Wiley,New York, 19693. Sander O R. AIP Conf. Proc. 212, Melville, NY, 1991,127-1554. Stockli M P. AIP Conf. Proc. 868, Melville, NY, 2006, 25-625. Carey D C. The Optics of Charged Particle Beams, Harwood Academic Publishers, Chur, 19876. Stockli M P, Welton R F. PAC 2005, 2705-27077. Stockli M P, Welton R F, Keller R. Rev. Sci. Instrum.,2004, 75: 1646-16498. Billen J H. Rev. Sci. Instrum., 1975, 46: 33-409. Allison P W, Sherman J D, Holtkamp D B. IEEE Trans.Nucl. Sci., 1983, NS-30: 2204-220610. Wollnik H, Ewald H. Nucl. Instrum. Methods, 1965, 36:93-10411. Stockli M P et al. AIP CP763, Melville, NY, 2005, 145-15812. Stockli M P et al. AIP CP749, Melville, NY, 2005, 108-11113. Spetke P et al. HEP NP, 2007, 31(Suppl.Ⅰ): 192(in Chinese)(Spetke P 等.高能物理与核物理, 2007, 31(增刊Ⅰ): 192)14. Hoffmann T et al. AIP CP546, Melville, NY, 2000, 432-439

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M.P.Stockli. Measuring and Analyzing Transverse Low-Energy Ion Beam Emittances[J]. Chinese Physics C, 2007, 31(S1): 182-186.

M.P.Stockli. Measuring and Analyzing Transverse Low-Energy Ion Beam Emittances[J]. Chinese Physics C, 2007, 31(S1): 182-186. shu

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Received: 2007-05-30
Revised: 1900-01-01

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沈阳化工大学材料科学与工程学院沈阳 110142

Measuring and Analyzing Transverse Low-Energy Ion Beam Emittances

M.P.Stockli ^,

Corresponding author: M.P.Stockli,

Spallation Neutron Source*, Oak Ridge National Lab, Oak Ridge, TN 37831, USA

Received Date: 2007-05-30
Accepted Date: 1900-01-01
Available Online: 2007-01-03

Abstract: The transverse emittance of an ion beam describes its transverse size as the particles are transported from a source to a target. It allows for predicting beam losses in limiting apertures and the beam focus size at the target. Various definitions and issues are discussed. The most common and emerging measuring techniques are presented, including their advantages. Several methods of emittance data analysis, their accuracy and trustworthiness, are discussed.