The Use of Numerical Calculation in the Analysis of Standardless Thick Target PIXE
- Received Date: 1986-12-20
Abstract: In this paper the numerical calculation is used to correct the characteristic K-X ray intensities measured in the analysis of thick target PIXE for the following matrix effects: the slowing down of protons, the absorption of characteristic X-rays, and the enhancement of X-ray induced X-ray emission in the sample. The efficiency calibrations for PIXE analysis system are made by means of the Monte Cario technique in order to do standardless analysis. Based on this, the PIXE analysis on some self-made standard thick specimens is made. The results are in full agreement with the known values of contents.





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