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Chinese Physics C> 2005, Vol. 29> Issue(1) : 86-90 

A Real-time System For Measuring Spot Size of High Energy Accelerator Using Thick Pinhole Imaging

  •  Department of Engineer Physics,Tsinghua University,Beijing 100084,China2 Northwest Institute of Nuclear Technology,Xi'an 710024,China

  • In order to easily measure the beam spot size of high energy electron accelerators with internal target enclosed,a real–time system, based on thick pinhole imaging technique, is employed. The experimental result on a 15MeV electron linear accelerator is also presented. In this paper the principle of thick pinhole imaging and the processing of data are introduced. The usual "sandwich" method needs to develop X-ray films, while debugging the accelerator parameters it will take a lot of time. On the contrary, X–ray pinhole imaging method can make a real–time measuring: as the accelerator parameters change, we can observe the beam profile's variation on the computer screen. Then when debugging we can have a definite object in view, and adjust the accelerator parameters more efficiently.
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    [1] . CHENG Cheng et al. Electron Linear Accelerator Instruments for Container Examination. Beijing: Engineering Physics Department of Tsinghua University, 2000, 51(in Chinese)(程诚等.集装箱检查用电子直线加速器装置.北京:清华大学工程物理系，2000,51)2. CHEN Hao, XU Zhou, JIN Xiao et al. High Power Laser and Particle Beams. , 2004, 16(3) : 390-394(in Chinese)(陈浩，许州，金晓等.强激光与粒子束，2004,16(3) :390-394)3. Durrant P T, Dallimore M et al. Nucl. Instrum. Methods in Physics Research. , 1999, A422( 3) : 667-6714. Wanno Lee, Gyuseong Cho. Annals of Nuclear Energy, 2002,29( 17) : 2029-2040

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WU Gang, LI Quan-Feng, CHENG Cheng, DU Tai-Bin, HEI Dong-Wei and LUO Jian-Hui. A Real-time System For Measuring Spot Size of High Energy Accelerator Using Thick Pinhole Imaging[J]. Chinese Physics C, 2005, 29(1): 86-90.
WU Gang, LI Quan-Feng, CHENG Cheng, DU Tai-Bin, HEI Dong-Wei and LUO Jian-Hui. A Real-time System For Measuring Spot Size of High Energy Accelerator Using Thick Pinhole Imaging[J]. Chinese Physics C, 2005, 29(1): 86-90. shu
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Received: 2004-05-18
Revised: 2004-06-29
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A Real-time System For Measuring Spot Size of High Energy Accelerator Using Thick Pinhole Imaging

    Corresponding author: WU Gang,
  • Department of Engineer Physics,Tsinghua University,Beijing 100084,China2 Northwest Institute of Nuclear Technology,Xi'an 710024,China
  • Received Date: 2004-05-18
  • Accepted Date: 2004-06-29
  • Available Online: 2005-01-05

Abstract: In order to easily measure the beam spot size of high energy electron accelerators with internal target enclosed,a real–time system, based on thick pinhole imaging technique, is employed. The experimental result on a 15MeV electron linear accelerator is also presented. In this paper the principle of thick pinhole imaging and the processing of data are introduced. The usual "sandwich" method needs to develop X-ray films, while debugging the accelerator parameters it will take a lot of time. On the contrary, X–ray pinhole imaging method can make a real–time measuring: as the accelerator parameters change, we can observe the beam profile's variation on the computer screen. Then when debugging we can have a definite object in view, and adjust the accelerator parameters more efficiently.

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