×
近期发现有不法分子冒充我刊与作者联系,借此进行欺诈等不法行为,请广大作者加以鉴别,如遇诈骗行为,请第一时间与我刊编辑部联系确认(《中国物理C》(英文)编辑部电话:010-88235947,010-88236950),并作报警处理。
本刊再次郑重声明:
(1)本刊官方网址为cpc.ihep.ac.cn和https://iopscience.iop.org/journal/1674-1137
(2)本刊采编系统作者中心是投稿的唯一路径,该系统为ScholarOne远程稿件采编系统,仅在本刊投稿网网址(https://mc03.manuscriptcentral.com/cpc)设有登录入口。本刊不接受其他方式的投稿,如打印稿投稿、E-mail信箱投稿等,若以此种方式接收投稿均为假冒。
(3)所有投稿均需经过严格的同行评议、编辑加工后方可发表,本刊不存在所谓的“编辑部内部征稿”。如果有人以“编辑部内部人员”名义帮助作者发稿,并收取发表费用,均为假冒。
                  
《中国物理C》(英文)编辑部
2024年10月30日

R&D Effort at NSCL with the Off-line ECR Ion Source ARTEMIS-B

Get Citation
G.Machicoane, M.Doleans, G.Humenik, F.Marti, P.Miller,
M.Steiner, J.Stetson, X.Wu and P.Zavodszky. R&D Effort at NSCL with the Off-line ECR Ion Source ARTEMIS-B[J]. Chinese Physics C, 2007, 31(S1): 187-191.
G.Machicoane, M.Doleans, G.Humenik, F.Marti, P.Miller,
M.Steiner, J.Stetson, X.Wu and P.Zavodszky. R&D Effort at NSCL with the Off-line ECR Ion Source ARTEMIS-B[J]. Chinese Physics C, 2007, 31(S1): 187-191. shu
Milestone
Received: 2007-05-30
Revised: 1900-01-01
Article Metric

Article Views(3034)
PDF Downloads(657)
Cited by(0)
Policy on re-use
To reuse of subscription content published by CPC, the users need to request permission from CPC, unless the content was published under an Open Access license which automatically permits that type of reuse.
通讯作者: 陈斌, bchen63@163.com
  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

  1. 本站搜索
  2. 百度学术搜索
  3. 万方数据库搜索
  4. CNKI搜索

Email This Article

Title:
Email:

R&D Effort at NSCL with the Off-line ECR Ion Source ARTEMIS-B

    Corresponding author: G.Machicoane,
  • National Superconducting Cyclotron Laboratory, Michigan State University, East Lansing, MI 48824, USA

Abstract: This paper reviews recent experimental work done with the off line source ARTEMIS-B at the NSCL. This source was built during the year 2005 and provides opportunities for off line development that can benefit the Coupled Cyclotron Facility (CCF) operation while minimizing the time taken away from the nuclear experimental program. The Artemis-B setup includes many beam diagnostics and a detailed description of the emittance scanner (Allison) and emittance measurement method is presented. A first beam dynamics study indicates that the analysis magnet has strong field aberrations and that the beam size in the dipole must be small in order to avoid significant beam brightness degradation. A second study compares beam brightness for different focusing systems between the ECR ion source and the analyzing magnet. Two electrostatic devices: a quadrupole triplet and a double quadrupole doublet have been tested successively and compared to a magnetic focusing solenoid. The experimental results tend to indicate a better beam brightness at smaller emittance for the electrostatic devices, although emittances measured for each focusing element were for a large part dependant on the tuning procedure developed to minimize the effects of the analyzing magnet.

    HTML

Reference (1)

目录

/

DownLoad:  Full-Size Img  PowerPoint
Return
Return