Impact factor of Chinese Physics C is 3.6 in 2023 Impact factor of Chinese Physics C is 3.6 in 2022 2021 Impact Factor 2.944
Advanced Search
Chinese Physics C> 2007, Vol. 31> Issue(10) : 933-937 

Use of Monte Carlo Method to Evaluate the Response of Direct Conversion X-Ray Detectors

  •  Institute of Optoelectronics Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, China2 Institute of Optoelectronics, Shenzhen University, Shenzhen 518060, China

  • The response of three semiconductor materials, polycrystalline HgI2, amorphous Se and polycrystalline CdTe, used for large area direct conversion detectors, is simulated by Monte Carlo method for X-ray photons in the diagnostic energy range (10—100keV). The simulation involves the transmission spectra, backscatting spectra, absorption efficiency and charge sensitivity. The interaction process between X-ray photons and the conversion materials is simulated by EGSnrc Monte Carlo code system and for the generation of signal charges Gaussian noise and the collection of partial charges are taken into account. The results show that deep traps in materials can affect largely detecting sensitivity when the mean free length (Schubweg) of carriers is less than the materials thickness. The sensitivity of HgI2 is 5 times higher than that of amorphous Se and CdTe is 10 times higher than amorphous Se, it can be seen that a high Z material can improve the detecting sensitivity greatly.
  • 加载中

  • References

    [1] . Haghigat A, Jeraj R, NewhauserWet al. Med. Phys., 2006,33: 21322. Strigari Lidia, Menghi Enrico, D'Andrea Marco et al. Med.Phys., 2006, 33: 33833. Kum. Med. Phys., 2006, 33: 21224. Ay M R, Sarkar S, Shahriari M et al. Med. Phys., 2005, 32:16605. Korn Alexander, Giersch Juergen, Hoheisel Martin. Proc.SPIE, 2005, 5745: 2926. Hoheisel Martin, Giersch Jurgen, Mitschke Michaela et al.Proc. SPIE, 2004, 5368: 3867. Guerra Del, Nelson W R, Russso P. Nuclear Instrumentsand Methods in Physics Research, 1991, A306: 3788. Conti M, Guerra A Del, Mazzei D et al. Nuclear Instru-ments and Methods in Physics Research, 1992, A322: 5919. Olmos P, Perez J M, Garcia-Belmonte G et al. Nuclear In-struments and Methods in Physics Research, 1991, A302:9110. Fano U. Phys. Rev., 1947, 72: 2611. Cavalleri G, Gatti E, Fabri G et al. Nucl. Instrum. Meth-ods, 1971, 92: 13712. Kasap S O. J. Phys. D: Appl. Phys., 2000, 33: 285313. Lederer C M, Shirley V S. Table of Isotopes. 7th Edition.New York: Wiley, 1978, 414. Storm E, Israel H I. Atom. Data Nucl. Data Tables, 1970,7: 56515. Winick Herman. X-ray Data Booklet. Lawrence BerkeleyNational Laboratory University of California, Berkeley, CA94720, 200116. Kabir M Z, Kasap S O, ZHAO W et al. IEE Proc.-CircuitsDevices Syst., 2003, 150: 25817. Yin Shi, Tumer Tumay O, Maeding Dale et al. IEEE Trans-actions on Nuclear Science, 2002, 49(1): 17618. Kolosov S A, Klevkov Yu V, Plotnikov A F. Semiconductors, 2004, 38(4): 455

  • Access

    加载中

Get Citation
GUI Jian-Bao, GUO Jin-Chuan, YANG Qin-Lao and NIU Han-Ben. Use of Monte Carlo Method to Evaluate the Response of Direct Conversion X-Ray Detectors[J]. Chinese Physics C, 2007, 31(10): 933-937.
GUI Jian-Bao, GUO Jin-Chuan, YANG Qin-Lao and NIU Han-Ben. Use of Monte Carlo Method to Evaluate the Response of Direct Conversion X-Ray Detectors[J]. Chinese Physics C, 2007, 31(10): 933-937. shu
Milestone
Received: 2006-12-05
Revised: 2007-03-09
Article Metric

Article Views(3608)
PDF Downloads(698)
Cited by(0)
Policy on re-use
To reuse of subscription content published by CPC, the users need to request permission from CPC, unless the content was published under an Open Access license which automatically permits that type of reuse.
通讯作者: 陈斌, bchen63@163.com
  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

  1. 本站搜索
  2. 百度学术搜索
  3. 万方数据库搜索
  4. CNKI搜索

Email This Article

Title:
Email:

Use of Monte Carlo Method to Evaluate the Response of Direct Conversion X-Ray Detectors

    Corresponding author: GUI Jian-Bao,
  • Institute of Optoelectronics Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, China2 Institute of Optoelectronics, Shenzhen University, Shenzhen 518060, China
  • Received Date: 2006-12-05
  • Accepted Date: 2007-03-09
  • Available Online: 2007-10-05

Abstract: The response of three semiconductor materials, polycrystalline HgI2, amorphous Se and polycrystalline CdTe, used for large area direct conversion detectors, is simulated by Monte Carlo method for X-ray photons in the diagnostic energy range (10—100keV). The simulation involves the transmission spectra, backscatting spectra, absorption efficiency and charge sensitivity. The interaction process between X-ray photons and the conversion materials is simulated by EGSnrc Monte Carlo code system and for the generation of signal charges Gaussian noise and the collection of partial charges are taken into account. The results show that deep traps in materials can affect largely detecting sensitivity when the mean free length (Schubweg) of carriers is less than the materials thickness. The sensitivity of HgI2 is 5 times higher than that of amorphous Se and CdTe is 10 times higher than amorphous Se, it can be seen that a high Z material can improve the detecting sensitivity greatly.

    HTML

Reference (1)

目录

Link
IOPScience
SCOAP3
arXiv
Chinese Physical Society
Journal information
Introduction
Editorial Board
Others
Subscribe
Contact us
QQ: 1307685413
Tel: +86-010-88235947
Fax: +86-010-88233126
E-mail: cpc@ihep.ac.cn

  • CPC Website

  • IOP Website

  • CPC WeChat

Copyright © Institute of High Energy Physics, Chinese Academy of Sciences, 19B Yuquan Road, Beijing 100049, China 京ICP备05002789号-1

Supported by: Beijing Renhe Information Technology Co. Ltd  E-mail: info@rhhz.net

/

DownLoad:  Full-Size Img  PowerPoint
Return
Return