Development of New Beam Profile and Emittance Measurement System for HLS

SUN Bao-Gen; ZHENG Pu; LU Ping; XU Hong-Liang; WANG Jun-Hua; WANG Ji-Gang; WANG Bao-Yun

Chinese Physics C> 2006, Vol. 30> Issue(8) : 792-796

Development of New Beam Profile and Emittance Measurement System for HLS

National Synchrotron Radiation Loboratory,University of Science and Technology of China, Hefei 230029, China2 Institute of Nuclear Physics and Chemistry, China Academy of Engineering Physics, Mianyang 621900, China

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Abstract：
The paper describes the ultraviolet light beam profile and emittance measurement system for HLS (Hefei Light Source). The system is based on the optical measurement, composed by two functional blocks: optical imaging and image acquisition. The optical imaging system is to form the 1:1 image of the ultraviolet part of SR on the surface of the CCD. The image acquisition system receives NTSC signal from the CCD camera which acquires the image of the ultraviolet part of SR, the signal is processed by a LabVIEW program to obtain the beam information of beam profile size, emittance and coupling between vertical and horizontal directions. Some measured results are also given.

References

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[8]	M.P.Stockli . Measuring and Analyzing Transverse Low-Energy Ion Beam Emittances. Chinese Physics C, 2007, 31(S1): 182-186.
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[18]	WANG Shu-Hong , YE Qiang , CAO Jian-She , MA Li , LIU Yu-Cheng , LE Qi , PEI Guo-Xi , ZHANG Jia-Fei . Emittance Measurement by Multi-Changing Focusing Strength. Chinese Physics C, 2002, 26(11): 1184-1188.
[19]	Chen Yinbao , Huang Zhibin , FuShinian . Scaling Law of Emittance Growth for Bunched Beam with Gaussian Density Distribution in Both Longitudinal and Transverse Directions in Linac. Chinese Physics C, 1997, 21(7): 657-663.
[20]	WEI Kai-Yu . INCREASE OF BEAM PROJECTIVE EMITTANCE IN SYSTEM WITH DISPERSION. Chinese Physics C, 1983, 7(5): 589-597.

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SUN Bao-Gen, ZHENG Pu, LU Ping, XU Hong-Liang, WANG Jun-Hua, WANG Ji-Gang and WANG Bao-Yun. Development of New Beam Profile and Emittance Measurement System for HLS[J]. Chinese Physics C, 2006, 30(8): 792-796.

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Received: 2005-11-04
Revised: 2005-11-29

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通讯作者: 陈斌, bchen63@163.com

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沈阳化工大学材料科学与工程学院沈阳 110142

Development of New Beam Profile and Emittance Measurement System for HLS

Corresponding author: SUN Bao-Gen,

National Synchrotron Radiation Loboratory,University of Science and Technology of China, Hefei 230029, China2 Institute of Nuclear Physics and Chemistry, China Academy of Engineering Physics, Mianyang 621900, China

Received Date: 2005-11-04

Accepted Date: 2005-11-29

Available Online: 2006-08-05

Abstract: The paper describes the ultraviolet light beam profile and emittance measurement system for HLS (Hefei Light Source). The system is based on the optical measurement, composed by two functional blocks: optical imaging and image acquisition. The optical imaging system is to form the 1:1 image of the ultraviolet part of SR on the surface of the CCD. The image acquisition system receives NTSC signal from the CCD camera which acquires the image of the ultraviolet part of SR, the signal is processed by a LabVIEW program to obtain the beam information of beam profile size, emittance and coupling between vertical and horizontal directions. Some measured results are also given.

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Development of New Beam Profile and Emittance Measurement System for HLS

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