Strong Electronic Excitation Effect of Swift Heavy Ions on C<SUB>60</SUB> Films

JIN Yun-Fan; TIAN Hui-Xian; LIU Jie; XIE Er-Qing; WANG Zhi-Guang; ZHANG Chong-Hong; SUN You-Mei; ZHU Zhi-Yong; YAO Cun-Feng

Chinese Physics C> 2004, Vol. 28> Issue(7) : 781-785

Strong Electronic Excitation Effect of Swift Heavy Ions on C₆₀ Films

Institute of Modern Physics,The Chinese Academy of Sciences,Lanzhou 730000,China2 School of Physical Science and Technology,Lanzhou University,Lanzhou 730000,China

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Abstract：
Strong electronic excitation effect of C₆₀ films induced by 2.0 GeV ¹³⁶Xe and 2.7GeV ²³⁸U ions was investigated by means of Fourier transform infrared (FTIR), Raman Scattering and X-ray diffraction (XRD) spectroscopies. A new peak located at 670 cm^－1, which corresponds to an unknown structure, was observed in the FTIR spectra of C₆₀ films irradiated for the first time. The variation in intensity of 670 cm^－1 peak with electronic energy loss and irradiation dose were studied. The analysis results indicated that electronic energy transfer dominates the damage process of C₆₀ films. The partial recovery of the damage in irradiated C₆₀ films at middle electronic energy loss is attributed to an annealing effect of the strong electronic excitation. The ion velocity also plays a role in the process of the damage creation.

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JIN Yun-Fan, TIAN Hui-Xian, LIU Jie, XIE Er-Qing, WANG Zhi-Guang, ZHANG Chong-Hong, SUN You-Mei, ZHU Zhi-Yong and YAO Cun-Feng. Strong Electronic Excitation Effect of Swift Heavy Ions on C₆₀ Films[J]. Chinese Physics C, 2004, 28(7): 781-785.

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Received: 2003-08-21
Revised: 1900-01-01

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沈阳化工大学材料科学与工程学院沈阳 110142

Strong Electronic Excitation Effect of Swift Heavy Ions on C₆₀ Films

Corresponding author: JIN Yun-Fan,

Institute of Modern Physics,The Chinese Academy of Sciences,Lanzhou 730000,China2 School of Physical Science and Technology,Lanzhou University,Lanzhou 730000,China

Received Date: 2003-08-21

Accepted Date: 1900-01-01

Available Online: 2004-07-05

Abstract: Strong electronic excitation effect of C₆₀ films induced by 2.0 GeV ¹³⁶Xe and 2.7GeV ²³⁸U ions was investigated by means of Fourier transform infrared (FTIR), Raman Scattering and X-ray diffraction (XRD) spectroscopies. A new peak located at 670 cm^－1, which corresponds to an unknown structure, was observed in the FTIR spectra of C₆₀ films irradiated for the first time. The variation in intensity of 670 cm^－1 peak with electronic energy loss and irradiation dose were studied. The analysis results indicated that electronic energy transfer dominates the damage process of C₆₀ films. The partial recovery of the damage in irradiated C₆₀ films at middle electronic energy loss is attributed to an annealing effect of the strong electronic excitation. The ion velocity also plays a role in the process of the damage creation.

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Strong Electronic Excitation Effect of Swift Heavy Ions on C₆₀ Films

Strong Electronic Excitation Effect of Swift Heavy Ions on C₆₀ Films