Secondary Electron Yield Studies on Vacuum Materials

ZHANG Yao-Feng; WANG Yong; WEI Wei; WANG Jian-Ping; FAN Le; GUAN Chang-Ying; LIU Zu-Ping

Chinese Physics C> 2008, Vol. 32> Issue(S1) : 68-70

Secondary Electron Yield Studies on Vacuum Materials

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Abstract：
A secondary electron yield test device for vacuum material study is set up, and its detailed design described in this paper. The test results for a few common vacuum materials with and without TiN film coating are presented, and the influential factors on secondary electron yield are analyzed. All the work will be helpful to the surface pretreatment of vacuum materials.

References

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ZHANG Yao-Feng, WANG Yong, WEI Wei, WANG Jian-Ping, FAN Le, GUAN Chang-Ying and LIU Zu-Ping. Secondary Electron Yield Studies on Vacuum Materials[J]. Chinese Physics C, 2008, 32(S1): 68-70.

ZHANG Yao-Feng, WANG Yong, WEI Wei, WANG Jian-Ping, FAN Le, GUAN Chang-Ying and LIU Zu-Ping. Secondary Electron Yield Studies on Vacuum Materials[J]. Chinese Physics C, 2008, 32(S1): 68-70. shu

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Received: 2008-01-10
Revised: 1900-01-01

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