Application of BSRF X-Ray Diffraction Station to Researches in Material Science
- Received Date: 1900-01-01
- Accepted Date: 1900-01-01
- Available Online: 1995-05-05
Abstract: This paper describes experimental apparatus and performance of the X-ray diffraction station at Beijing Synchrotron Radiation Facility (BSKF). Using a SR source of BEPC and the X-ray diffractometer, the study of multilayers and semiconductor superlattice structure, as well as the measurements of residual stress relaxation anddistribution around the ceramic-metal (Si3N4/Steel) interface have been developed.





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