Employing a Cerenkov detector for the thickness measurement of X-rays in a scattering background

Get Citation
LI Shu-Wei, KANG Ke-Jun, WANG Yi, LI Jin, LI Yuan-Jing and ZHANG Qing-Jun. Employing a Cerenkov detector for the thickness measurement of X-rays in a scattering background[J]. Chinese Physics C, 2010, 34(12): 1895-1899.
LI Shu-Wei, KANG Ke-Jun, WANG Yi, LI Jin, LI Yuan-Jing and ZHANG Qing-Jun. Employing a Cerenkov detector for the thickness measurement of X-rays in a scattering background[J]. Chinese Physics C, 2010, 34(12): 1895-1899. shu
Milestone
Received: 2010-01-19
Revised: 2010-04-27
Article Metric

Article Views(2524)
PDF Downloads(518)
Cited by(0)
Policy on re-use
To reuse of subscription content published by CPC, the users need to request permission from CPC, unless the content was published under an Open Access license which automatically permits that type of reuse.
通讯作者: 陈斌, bchen63@163.com
  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

  1. 本站搜索
  2. 百度学术搜索
  3. 万方数据库搜索
  4. CNKI搜索

Email This Article

Title:
Email:

Employing a Cerenkov detector for the thickness measurement of X-rays in a scattering background

    Corresponding author: LI Shu-Wei,

Abstract: 

The variation in environmental scattering background is a major source of systematic errors in X-ray inspection and measurement systems. As the energy of these photons consisting of environmental scattering background is much lower generally, the Cerenkov detectors having the detection threshold are likely insensitive to them and able to exclude their influence. A thickness measurement experiment is designed to verify the idea by employing a Cerenkov detector and an ionizing chamber for comparison. Furthermore, it is also found that the application of the Cerenkov detectors is helpful to exclude another systematic error from the variation of low energy components in the spectrum incident on the detector volume.

    HTML

Reference (1)

目录

/

DownLoad:  Full-Size Img  PowerPoint
Return
Return