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Abstract:
Fine structures appearing in boron nitride(BN) sample bomparded by N2+ ion (60keV) were examined by JEM-200cx high-resolution transmission electron microscopy (HRTEM) at 200kV accelerating voltage. In the curved region of plate-like h-BN crystal sp2 sheets (spacing 0.33nm), it was observed that the t-BN structure with an average interplaner spacing of 0.35 nm was formed. Although the mechanism of formation of the t-BN structure is nuclear, it appears that our discussion based on the viewpoint of beam-solid interaction may be critical in understanding the growth process of the t-BN structures.
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