Electro-optical sampling non-synchronous delay scanning measurement ofelectron beam bunch length at BFEL

SUN Da-Rui; XU Jin-Qiang; CHEN Sen-Yu

doi:10.1088/1674-1137/34/2/014

Chinese Physics C> 2010, Vol. 34> Issue(2) : 227-230 DOI: 10.1088/1674-1137/34/2/014

Electro-optical sampling non-synchronous delay scanning measurement ofelectron beam bunch length at BFEL

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Abstract：
The Electro-optical sampling delay scanning technique can be used for electron beam bunch length measurement. A novel non-ynchronous delay scanning technique based on the electro-optical sampling measurements is presented. Based on Beijing Free Electron Laser (BFEL), the electron beam bunch length was measured with the electro-optical sampling technique for the first time in China. The result shows that the electron beam bunch length at BFEL is about 5.6±1.2 ps.

References

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. Schlarb H. Diagnostic Tools for Ultra-Low Emittance andUltra-Short Electron Bunches. In Proc. of the 2000 Europ.Part. Acc. Conf. Vienna, 2000, 187-1912. SUN Bao-Gen, LUO Qing, WANG Xiao-Hui. Chin. Phys.C, 2008, 32(S1): 145-147 (in Chinese)3. Berden G, Knippels G M H, Oepts D et al. Single Short Electron- Beam Bunch Length Measurements. In Proc. DI-PAC 2003 Mainz. Germany, 2003, IT05, 20-244. YAN X, MacLeod A M, Gillespie W A et al. Phys. Rev.Lett., 2000, 85(16): 3404-34075. SUN Da-Rui, XU Jin-Qiang, TANG Kun. High PowerLaser and Particle Beams, 2008, 20(2): 349-352 (in Chi-nese)

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SUN Da-Rui, XU Jin-Qiang and CHEN Sen-Yu. Electro-optical sampling non-synchronous delay scanning measurement ofelectron beam bunch length at BFEL[J]. Chinese Physics C, 2010, 34(2): 227-230. doi: 10.1088/1674-1137/34/2/014

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Received: 2009-06-24
Revised: 2009-07-14

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