Production of highly charged argon ions from a room temperature electron beam ion trap
- Received Date: 2007-07-19
- Accepted Date: 2007-11-20
- Available Online: 2008-05-05
Abstract:
In this work, highly charged ions have been extracted from the advanced Electron Beam Ion Source (EBIS-A) developed in a scientific cooperation between the Dresden University of Technology and the DREEBIT GmbH Dresden. The charge state distributions of ions extracted from the EBIS-A are measured in the pulse and leaky modes under different operation conditions. Ar16+ ions with current of 2 pA are produced and extracted in the leaky mode. 3×105 Ar18+ ions per pulse are extracted in the pulse mode. The ion charge state distribution is a
function of the ionization time.