• [1]

    Mimura H, Handa S, Kimura T et al. Nat. Phys., 2010, 6: 122

  • [2]

    Bluhma H, Andersson K, Araki T et al. J. Electron. Spectrosc. Relat. Phenom., 2006, 150: 86

  • [3]

    Mimura H, Yumoto H, Matsuyama S et al. Appl. Phys. Lett., 2007, 90: 051903

  • [4]

    Schroer C G, Kurapova O, Patommel J et al. Appl. Phys. Lett., 2005, 87: 124103

  • [5]

    CHAO W, Harteneck B D, Liddle J A et al. Nature, 2005, 435: 1210

  • [6]

    YAN H, KANG H, Conley R et al. X-ray Optics and Instrumentation, 2010, 2010: 401854

  • [7]

    HUANG X, YAN H, Nazaretski E et al. Scientific reports, 2013, 3: 3562

  • [8]

    HUANG Q, LI H, SONG Z et al. Chin. Phys. C, 2013, 37(2): 028002

  • [9]

    Attwood D. Soft X-rays and Extreme Ultra violet Radiation: Principles and Applications. Cambridge: Cambridge University Press, 1999. 349-356

  • [10]

    Jahedi N, Conley R, Shi B et al. Nucl. Instrum. Methods A, 2013, 616: 89